Tag Archives: Built-In Self Test

ScanWork Validation and Testing Tools Support Future Intel Platforms

ASSET InterTech has enhanced their validation and testing tools for Intel’s future platforms. ASSET’s ScanWorks platform for embedded instruments will continue to support Intel’s Interconnect Built-In Self Test (IBIST) technology, which is embedded in the processors and chip sets. In addition, ScanWorks will provide a comprehensive validation solution for high-speed input/output (I/O) on Intel platforms.

Continue reading