Tag Archives: ASSET InterTech

White Paper: IEEE P1687 IJTAG Taps into Embedded Instrumentation

ASSET InterTech recently published a white paper, IEEE P1687 Internal JTAG (IJTAG) taps into embedded instrumentation. The technical paper explains how the new IEEE P1687 IJTAG standard will enable instruments that were originally embedded into chips for chip characterization and test can be re-used later in circuit board design validation, volume manufacturing test and field service troubleshooting.

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ScanWork Validation and Testing Tools Support Future Intel Platforms

ASSET InterTech has enhanced their validation and testing tools for Intel’s future platforms. ASSET’s ScanWorks platform for embedded instruments will continue to support Intel’s Interconnect Built-In Self Test (IBIST) technology, which is embedded in the processors and chip sets. In addition, ScanWorks will provide a comprehensive validation solution for high-speed input/output (I/O) on Intel platforms.

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