'Test Solution' Category Archive

Avery Design PCI-Xactor for PCI Express Gen2

Posted by Ken Cheung in EDA Tools, Test Solution on Tuesday, August 21, 2007

PCI-Xactor for PCI Express, from Avery Design Systems, provider of industry proven Verification IP for PCI Express and Parallel/Serial ATA, offers comprehensive coverage on the digital logic portion of the PCI–SIG Protocol Checklist. PCI-Xactor for PCI Express 2.0 (Gen2) is for functional verification of PCI Express designs.
The new release fully supports Gen2 including Root Complex, [...]

National Instruments LabVIEW SignalExpress

Posted by Ken Cheung in Test Solution on Monday, July 23, 2007

National Instruments (Nasdaq:NATI) LabVIEW SignalExpress is a graphical system design platform. LabVIEW SignalExpress simplifies data logging and instrument control. Built on the basic measurement, analysis and reporting capabilities of NI LabVIEW graphical programming, LabVIEW SignalExpress delivers an easy-to-use, drag-and-drop experience for controlling hundreds of measurement devices.

Agilent N5431A Software

Posted by Ken Cheung in Test Solution on Tuesday, June 19, 2007

The Agilent N5431A software, which runs on Agilent 80000 Series Infiniium oscilloscopes and digital signal analyzers, helps engineers confirm that their devices conform to the XAUI specifications as defined by the IEEE 802.3-2005 10-gigabit Ethernet specification. XAUI is a chip-to-chip interface designed to transmit 10-gigabit signals over long distances on printed circuit boards. Because of [...]

Agilent Medalist i3070 In-Circuit PCB Test System

Posted by Ken Cheung in Test Solution on Wednesday, June 13, 2007

The Medalist i3070 in-circuit test system, by Agilent Technologies Inc. (NYSE:A), is a test system for printed circuit board assembly. Advanced algorithms provide analog test throughput increase by up to 50% compared with legacy Agilent Medalist 3070 systems. Simple graphical user interfaces are designed to maximize ease-of-use for operators in the fast-paced high-volume manufacturing environment.
The [...]

Aeroflex W-CDMA ACE 3G Protocol Analysis Test System

Posted by Ken Cheung in Test Solution on Wednesday, April 25, 2007

The Aeroflex W-CDMA ACE 3G protocol analysis test system is a powerful, yet affordably priced, network emulator designed specifically to meet the needs of design teams focusing on integration and regression testing of W-CDMA mobile devices. The Aeroflex W-CDMA ACE has been designed to facilitate integration and regression testing much earlier in the design cycle [...]

Agilent Visual Engineering Environment Software

Posted by Ken Cheung in Test Solution on Tuesday, April 3, 2007

Agilent's Visual Engineering Environment (VEE) software is a powerful, interactive, and open graphical language that is designed to provide a fast and easy path to measurement analysis. Agilent VEE Pro 8.0 and Agilent VEE Express 8.0 make measurement analysis easy with task-oriented building blocks, enabling engineers to focus on connecting instruments, measuring their device, analyzing [...]

Agilent PNA-X Network Analyzer

Posted by Ken Cheung in Test Solution on Tuesday, March 27, 2007

The Agilent PNA-X network analyzer features microwave network analysis from 10 MHz to 26.5 GHz. This premier-performance network analyzer offers a unique single-connection solution for two-tone and swept LO measurements, featuring an integrated second source and signal combining network. The Agilent PNA-X reduces test costs, setup time, measurement complexity and the time it takes to [...]

Aeroflex A-GPS Mobile Handset Test Solutions

Posted by Ken Cheung in Test Solution on Thursday, February 15, 2007

Aeroflex's fully integrated solution for testing A-GPS (Assisted-GPS) enabled mobile handsets is based on the Aeroflex 6103 AIME and 6103 AIME/CT mobile handset test systems. It has been designed to address the rapidly emerging development and conformance test requirements for A-GPS-based mobile handsets by testing A-GPS implementation in the laboratory thereby eliminating the need for [...]

LitePoint IQmax WiMAX Test System

Posted by Ken Cheung in Test Solution, Wireless on Wednesday, January 24, 2007

In addition to the 3.3 to 3.8GHz band already supported by the single-band version of the LitePoint IQmax Test System, the tri-band version supports testing fixed and mobile WiMAX products in the 2.15 to 2.7 GHz and 4.9 to 6.0 GHz bands as well as optional test support for WiFi and Bluetooth(R) products.
Based on an [...]

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