'Test Solution' Category Archive

LDRA TBreq 2.0 for Embedded Software Development

Posted by Ken Cheung in Test Solution on Monday, April 21, 2008

LDRA recetnly released TBreq® 2.0, the latest version of its collaborative, requirements-based embedded software development and verification solution. TBreq 2.0 incorporates important new and enhanced features for the automation of key verification activities along with a new, more intuitive GUI that significantly improves usability.
In addition to automating unit testing, TBreq 2.0 evolves the product into […]

Agilent InfiniiVision 7000 Series Oscilloscopes

Posted by Ken Cheung in Test Solution on Thursday, April 17, 2008

Agilent Technologies Inc. (NYSE:A) InfiniiVision 7000 Series of mixed-signal and digital-storage oscilloscopes offer bandwidths up to 1 GHz and delivers a deep memory waveform update rate of up to 100,000 waveforms per second. Each model, equipped with the industry's largest display — a 12.1-inch XGA LCD display — comes in a package that is just […]

Agilent Boundary Scan-VTEP Vectorless Hybrid Testing

Posted by Ken Cheung in Test Solution on Tuesday, April 8, 2008

Agilent Technologies Inc. (NYSE:A) recently announced an innovative way to test printed circuit board assemblies (PCBAs) in a limited access environment without sacrificing test coverage or time-to-market — while simultaneously saving on fixture cost and reducing test resources. The technology is a hybrid between two established test methodologies in today's electronic manufacturing test environment: Boundary […]

Tektronix TekExpress SATA

Posted by Ken Cheung in Test Solution on Monday, March 31, 2008

Tektronix, Inc. recently announced the TekExpress(tm) compliance test automation framework and new TekExpress SATA automated compliance test software. Running on the TekExpress framework, TekExpress SATA leverages Tektronix's serial data performance instruments to automate 100% of the required SATA Gen-1 and SATA Gen-2 compliance tests for receivers, transmitters, and interconnects. The TekExpress compliance automation framework has […]

Kozio kDiagnostics Manufacturing Suite

Posted by Ken Cheung in Test Solution on Wednesday, March 26, 2008

The Kozio kDiagnostics(tm) Manufacturing Suite is a new productivity enhancing suite that includes functional test suites for core memories, busses and peripheral devices. kDiagnostics is a complete and thorough automated test setup that reduces operator interaction, speeds up device testing and programming, and provides an easy-to-deploy solution. The new tools enable electronic manufacturers to reduce […]

Agilent N5183A MXG Microwave Analog Signal Generator

Posted by Ken Cheung in Test Solution on Wednesday, March 26, 2008

The N5183A MXG, from Agilent Technologies Inc. (NYSE:A), is a compact microwave analog signal generator that provides frequency coverage to 20, 32 or 40 GHz. Featuring fast frequency switching speeds, high reliability and easy self-maintenance, this mid-performance signal generator provides manufacturing and R&D engineers working on broadband components and systems with the performance required to […]

Strategic Test UF2e-4721, UF2e-4020 Data Acquisition Cards

Posted by Ken Cheung in Test Solution on Monday, March 3, 2008

Strategic Test Corp. recently introduced two new 250 kHz 16-bit data acquisition cards for PCI Express. The UF2e-4721 has 16 analog inputs and the UF2e-4020 has 8 channels. Unique features include the options for dual-timebase sampling, synchronous digital inputs, asynchronous digital I/O and the possibility to synchronize up to 4336 channels. Drivers and programming examples […]

Device Testing Slows Product Innovation

Posted by Ken Cheung in Articles, Test Solution on Sunday, March 2, 2008

By Tom Ryan, CEO, The Fanfare Group
Constant product innovation has contributed to a thriving equipment-manufacturing industry over the last two decades. The enabler for innovation has been a steady stream of new tools and technologies that help software developers work faster and smarter. Developers have been empowered to be more productive, but QA groups have […]

Agilent Infiniium DSO90000A Series Oscilloscope

Posted by Ken Cheung in Test Solution on Thursday, February 21, 2008

Agilent Technologies Inc. (NYSE:A) broke the one-billion acquisition samples (1 Gpt) barrier for the first time in a high-performance oscilloscope. The new Agilent Infiniium 90000A Series offers the world's deepest acquisition memory depth and offers the first hardware/software integrated triggering system — InfiniiScan Plus. The InfiniiScan Plus enables 150 picoseconds hardware-event identification and 75 picoseconds […]

Wind River Workbench 3.0, On-Chip Debugging

Posted by Ken Cheung in Test Solution on Wednesday, February 6, 2008

Wind River Workbench® 3.0, On-Chip Debugging is a comprehensive JTAG embedded device development toolset for mitigating the complexities of on-chip debugging. Wind River Workbench, On-Chip Debugging includes support for key new processors in the mobile device market and introduces new enhancements designed to make device hardware and software development and debug simpler and more intuitive. […]

Mentor Graphics TestBench XPress 3.0

Posted by Ken Cheung in Models, Simulations, Test Solution on Tuesday, February 5, 2008

Mentor Graphics Corp. (Nasdaq: MENT)recently the third generation of TestBench Xpress(tm) (TBX). TBX's RTL-accurate virtual emulation capability eliminates the traditional barriers of adopting hardware in-circuit emulation for system-level integration. When used in conjunction with Mentor's Veloce® family of hardware assisted verification products, TBX provides a software based, cost-effective and efficient way to perform hardware-software co-verification […]

VScope Embeds Oscilloscope into IC

Posted by Ken Cheung in Test Solution on Monday, February 4, 2008

VScope(tm), from Vitesse Semiconductor Corporation (Pink Sheets:VTSS), is a new Integrated Circuit (IC)-based waveform viewing technology. VScope embeds the oscilloscope function into the receiver of ICs used in communication systems, thus offering direct viewing of signal characteristics similar to traditional lab oscilloscopes. Evaluation boards will be available in the second quarter of 2008.

Agilent N5970A Interactive Functional Test Software

Posted by Ken Cheung in Test Solution, Wireless on Thursday, January 24, 2008

Agilent Technologies Inc. (NYSE: A) announced their new N5970A Interactive Functional Test (IFT) software for its 8960 Series 10 (E5515C) Wireless Communications Test Set. The new IFT software provides an automated and simplified interface for realistically testing "user experience" by stress testing cellular mobile devices in real-world network scenarios. By allowing earlier identification of design […]

Ellisys Explorer EX260

Posted by Ken Cheung in Test Solution on Monday, January 14, 2008

Explorer EX260, by Ellisys, is an easy-to-use protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification, and performance analysis. EX260 is a multifunction protocol analyzer and packet generator offering Automated Compliance Testing. The EX260, based on hardware combining 1 GB of memory with a custom-made, high-performance processor, has the […]

If you found this page useful, bookmark and share it on:
 
Embedded Star Newsletter
Don't have time to visit Embedded Blog everyday? Then sign up for our free newsletter. We'll send you an email when we have something to share with you. Your email address will be kept confidential and we will not share, sell, or rent it to anyone. You can unsubscribe at any time by clicking a link in the email.

Enter your email address to sign up for our free newsletter:   

If you are familiar with RSS feeds, you can also sign up for our free blog feed. Our RSS feed is updated in real-time while our newsletter is updated daily.