The Industrial Grade DRAM Reliability Testing Improvement

The Industrial Grade DRAM Reliability Testing Improvement

ATP has integrated the Automated Test Equipment (ATE) and Test During Burn In (TDBI) tests and the Supervisory Control and Data Acuqisition (SCADA) system into one mass-production-scale burn-in test system.

The entire system is designed to:

  • build a system for quality data acquisition
  • implement a system for process improvement
  • support a wide testing temperature range from -40 °C to 85 °C
  • provide real time remote monitoring and control

The unique of a combined TDBI and ATE system compared to the conventional large thermal chambers and other proprietary test systems is highlighted in this white paper.