ASSET InterTech recently published a white paper, IEEE P1687 Internal JTAG (IJTAG) taps into embedded instrumentation. The technical paper explains how the new IEEE P1687 IJTAG standard will enable instruments that were originally embedded into chips for chip characterization and test can be re-used later in circuit board design validation, volume manufacturing test and field service troubleshooting.
The technical paper describes and illustrates the on-chip IJTAG architecture. In addition, the whitepaper also describes how validation, test and debug engineers will be able to deploy IJTAG-based tools to automate and schedule the operations of embedded instrument. The paper was written by Al Couch, ASSET’s chief technologist for core instrumentation and co-chairman of the IEEE P1687 IJTAG working group.
IEEE P1687 Internal JTAG (IJTAG) taps into embedded instrumentation
For many years, chip makers have routinely embedded test and measurement functionality into their high-end, high-speed devices. This was done out of necessity by the chip makers. They had found that this was the most effective and cost-efficient way to characterize, validate and test their devices.
Now, these high-end chips have entered the mainstream. As a result, the industry is realizing that there is a great wealth of test and measurement, and design-for-test (DFT) intellectual property (IP) embedded on-chip that can be put to good use in a wide range of applications to more cost-effectively validate, test and debug chips, circuit boards and systems throughout their entire life-cycles. The new IEEE P1687 Internal JTAG (IJTAG) standard is a step in this direction.
This paper describes the objectives of the IEEE P1687 working group, how it achieved those objectives and the resulting IJTAG architecture that is embodied in the standard.
More info: IEEE P1687 Internal JTAG (IJTAG) taps into embedded instrumentation (pdf)