Agilent Medalist i1000D In-Circuit Test System
Agilent Technologies Inc. (NYSE:A) rolled out the Medalist i1000D in-circuit test system with digital test capabilities. The i1000D comes with full native boundary scan test capabilities and Agilent’s latest VTEP v2.0 Powered vectorless test suite, which offers the latest award-winning Cover-Extend Technology. The Medalist i1000D ICT starts shipping in the third quarter of calendar year 2009. The i1000D bridges a growing solution gap between high-functionality in-circuit testers and low-end manufacturing defects analyzers.
Medalist i1000D Features
- Per pin programmability
- Digital PCF/VCL library-based testing
- Native boundary scan capabilities
- I2C/SPI serial programming
- Simple, low-cost long-wired test fixture
- Flexible, easy-to-use graphical user interface
More info: Agilent Technologies
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