Nova Measuring Instruments Ltd. develops, produces, and markets advanced monitoring, measurement and process control systems for the semiconductor manufacturing industry. Nova provides a broad range of innovative high-end metrology solutions that link between different semiconductor processes. In 2006, Nova acquired a leading developer of WA-XRD technology, specializing in Microstructure Analysis.
Founded in 1993, Nova pioneered the field of integrated metrology (IM) for thin film measurement on semiconductor wafers, and was the first to introduce an IM solution for chemical-mechanical polishing (CMP). Today, Nova is a global company with four customer support subsidiaries and the largest installed base worldwide. It continues to lead the industry in innovation, quality and service, offering state of the art solutions for CMP, Etch, CVD and Photolithography with thin film thickness and critical dimension (CD) measurement. In 2006, Nova acquired a leading developer of wide-angle X-Ray Diffraction (XRD) technology, specializing in Microstructure Parameter Characterization. The creation of this new business unit - Nova Microstructure Division - further leverages Nova's strategic market expansion.
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