LogicVision, a leader in at-speed embedded test, provides nanometer test IP, silicon debug, and yield learning software solutions. ETCreate tools instantiate test structures directly into a semiconductor architecture at the RT level. These embedded structures operate as "eyes in the die," observing and testing the device at its natural operating speed. ETAccess interfaces these internal structures with external testers, and identifies and analyzes device failures. LogicVision's yield analysis software, Yield Insight, automates focused parametric verification throughout the semiconductor manufacturing process.

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