White-Box Verification for Complex Designs

This white paper discusses the use of white-box verification techniques to help accelerate the discovery and diagnosis of bugs during functional verification. Reducing the time required to verify a design, especially when coupled with design reuse, improves the overall development cycle for complex chips and accelerates the time-to-market for new electronic products. In addition, the white-box approach verifies designs more thoroughly, thereby improving quality and potentially eliminating chip re-spins that can have a disastrous effect on project completion and product introduction. This paper also describes in detail the dynamic formal verification approach used in products from 0-In Design Automation and provides examples of design bugs detected by this method.

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