Using FastScan Diagnostics to Improve Time-to-Volume

As the level of integration on leading edge semiconductor products continues to increase, the process technologies to fabricate these devices must also keep pace. Today's semiconductor products use Design-for-Test (DFT) techniques, such as scan and Automatic Test Pattern Generation (ATPG), to ensure defective parts are identified before they get to the end customer. In order to remain competitive, ensuring high quality (typically measured in defects-per-million or DPM), is not enough. As new process technologies are introduced, it is crucial to ramp them to high-volume, high-yield production levels as quickly as possible.

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