TestKompress with EDT Technology: Reducing Time and Expense in Test

While the cost of semiconductor manufacturing continues to drop sharply year after year, the cost of test continues to rise. Skyrocketing gate count, increasing complexity, growing production volumes and smaller silicon feature sizes all contribute to the rise. The traditional approach for increasing test capacity is to purchase larger, more expensive automatic test equipment (ATE). This publication describes how the TestKompress tool, based on embedded deterministic test technology, reduces both the scan test data volume and testing time by up to a factor of 10 and how this drastic reduction allows manufacturers more flexibility in the management of ATE machines as assets and results in faster time-to-market and lower test costs.

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