Single Event Latchup Protection Of Integrated Circuits

This paper reports the test results from the development of the single event latchup protection circuitry (referred to as Maxwell Technologies LPT(TM) technology) for several integrated circuits which are known to latchup at unacceptably low LET energies for space applications. Two devices were evaluated with LPT; the ADS7805 16 bit analog to digital converter and the GF10009 FPGA (Gatefield's 9000 gate flash programmable gate array).

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