Embedded Deterministic Test - DFT Technology for Low-Cost IC Manufacturing Test

Test costs represent a major and rapidly increasing percentage of IC (integrated circuits) manufacturing costs. Embedded Deterministic Test (EDT) is a new Design-for-Test (DFT) technology that reduces manufacturing test costs by providing up to 10 times reduction in test data volume and scan test time. In addition, EDT maintains all the benefits of a conventional scan/ATPG DFT methodology, including high test quality, simple implementation flow, and ease of use. This publication introduces EDT technology, describes how the TestKompress tool incorporates EDT in a design flow, provides experimental results using TestKompress, and demonstrates the impact of the product on tester throughput.

View Entire Paper | Previous Page | White Papers Search

If you found this page useful, bookmark and share it on: