ATPG Pattern Compaction - the Next Wave

The "cost of test" is an issue that is gaining widespread attention. This is because the fabrication cost per transistor is falling rapidly, while the test cost is not scaling in the same manner. The most fundamental cause is the increasing volume of test data required, the corresponding increased ATE memory cost, and longer test application time. This cost trend has often been predicted as a fundamental limit on conventional scan based test. This whitepaper discusses possible solutions for test pattern data volume and achieving high test coverage.

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