IC Tools White Papers
- The Effects of Hierarchy on Debug time in Formal Verification Tools with and without Decompositional Verification
- Early Silicon Performance
- Noise-aware Timing Analysis
- Closing the Nanometer Yield Chasm
- Overview of Magma's FixedTiming Methodology
- Substrate Noise Analysis of Mixed-signal ICs
- Automated Layout of a Mixed-signal IC for a Laser Distance Measuring System
- Substrate Coupling Analysis for RF Circuits
- Receiver Characterization Using Periodic Small-signal Analysis
- Behavioral Modeling of RF Circuits in Spectre RF
- Gain-based Synthesis: Speeding RTL to Silicon
- Signal and Design Integrity
- Scan-Based At-Speed Testing for the Fastest Chips
- PKS Concurrent Optimization
- Accurate Fourier Analysis for Circuit Simulators
- A Full-Chip Hierarchical Design System
- Deep-Submicron Signal Integrity
- TestKompress with EDT Technology: Reducing Time and Expense in Test
- Embedded Deterministic Test - DFT Technology for Low-Cost IC Manufacturing Test
- Using FastScan Diagnostics to Improve Time-to-Volume
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