6/24/2004 - Tektronix, Inc. (NYSE: TEK), a leading worldwide provider of test, measurement and monitoring instrumentation, announced the introduction of a modular sampling oscilloscope - the TDS8200. The company also introduced the 82A04 phase reference module which will enable design engineers to characterize and validate performance of leading-edge products. The new oscilloscope can be configured to provide bandwidth to 70 GHz and is the only single-ended and differential clock recovery system covering all current and emerging serial data standards between 50 Mb/s and 12.6 Gb/s. The TDS8200 offers an industry-best system jitter of <200 fs RMS at these data rates. The TDS8200 enables designs with tighter tolerances, thus reducing costs and increasing component performance.
Characterizing serial data signals with embedded clocks has historically been a significant challenge. Electrical signal standards such as XAUI at 3.125 Gb/s and 2x XAUI at 6.25 Gb/s require instruments that can acquire these complex signals at ultra fast data rates and that can be used for precise characterization. Designs with limited jitter budgets and tight timing margins require the test equipment with the best signal fidelity and ability to provide accurate and repeatable results. To handle differential signals, test equipment must be flexible enough to provide true differential acquisition and clock recovery across multiple data rates. The new TDS8200 sampling oscilloscope meets these needs.
"Digital designers are continually pushing the limits of test and measurement equipment," said John Taggart, General Manager, Electro Optical Products, Tektronix, Inc. "The introduction of the TDS8200 and 82A04 represent unparalleled flexibility and a significant leap forward for acquisition and characterization of serial data signals from 2 to 12.5 Gb/s. For the fastest and most demanding applications, customers can obtain the most accurate test results using the TDS8200 Series measurement system."
The TDS8200 improves upon earlier models by providing system jitter of <200 fs RMS. This improved measurement system fidelity can eliminate false test failures and enables more accurate characterization of design tolerances which results in increased component performance and reduced costs. The TDS8200 acquires data up to 25 times faster than competing solutions while measuring in low-jitter timebase phase reference mode. Using FrameScanTM, Tektronix-exclusive acquisition mode, the TDS8200 also provides the ability to measure random and deterministic jitter. With these new oscilloscope features, engineers are better able to perform accurate, repeatable compliance testing of high-speed, low power differential signals with the capability to trigger on embedded clocks, facilitating creation of new leading edge products.
"As the speed of our designs increases, the eye closure associated with the 1 ps RMS system jitter of instruments currently in the market is becoming a significant issue," said William George, Senior Vice President Operations, Chief Manufacturing Officer, ON Semiconductor. "The TDS8200 with the 82A04 phase reference module is the only measurement system that provides us <200 fs RMS system jitter and adequate bandwidth to accurately characterize our new 6 Gb/s designs. This capability enables us to stay ahead of competitors and bring products to market faster. The TDS8200 is the 'golden reference' for testing emerging serial data standards."
Fast Clock Recovery for Testing Latest Standards
With the 80A05 Electrical Clock Recovery Module, the TSD8200 also provides the only differential clock recovery solution for all current and emerging serial data standards from 50 Mb/s to 12.6 Gb/s. It is also the industry's only clock recovery solution for differential and single-ended signals from 3 to 6 Gb/s. Emerging standards in this space include XAUI, 2x XAUI and SATA2. When combined with the 80E0x electrical signal acquisition module, the measurement system provides a complete electrical signal analysis and clock recovery solution for differential and single-ended signals.
In addition to standard rate support, users can specify custom bit rates in order to test devices, modules and systems running at emerging or non-standard rates, enabling users to work within data ranges. The wide clock recovery range and support for user-specified bit-rates - all in a single module - provides a complete clock recovery solution for testing of a wide range of computer and communications signaling rates and standards.
Tektronix, Inc. is a test, measurement, and monitoring company providing measurement solutions to the communications, computer, and semiconductor industries worldwide. With more than 55 years of experience, Tektronix enables its customers to design, build, deploy, and manage next-generation global communications networks and advanced technologies. Headquartered in Beaverton, Oregon, Tektronix has operations in 19 countries worldwide. Tektronix' Web address is www.tektronix.com.
Tektronix is a registered trademark of Tektronix, Inc.
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