Agilent Technologies Highlights New Technologies at SEMICON China

3/15/2004 - Agilent Technologies Inc. (NYSE: A) announced it will demonstrate new test solutions for system-on-a-chip (SOC), flash memory and parametric test at SEMICON China 2004 in Shanghai, March 17-19, at Booth 7157. Agilent will also highlight its efforts to create a more integrated semiconductor industry supply chain in China.

Agilent will unveil an addition, the Agilent V4000, to the Versatest memory test series and will introduce new parametric test systems tailored for the China market. The company will also demonstrate the first commercial set-top-box devices from Haier (Beijing) IC Design Company Ltd. and the first IEEE 802.11b wireless LAN chip, Wantong-II, being tested using the Agilent 93000 SOC Series.

"Agilent is a key partner in developing the IC industry in China, supplying superior test solutions and services that improve our customers' business results," said Tom Newsom, vice president and general manager of Agilent's SOC Business Unit. "From test systems and engineering solution development to education services, we provide quality products that deliver the cost performance our customers require."

Agilent Helps Manufacturers in China Integrate Supply Chain
Agilent's test platforms successfully integrate the semiconductor supply chain in China. Data from design houses is now integrated to subcontract manufacturers, ensuring that design, production and testing are closely tied. Executives from Datang, Haier, SGNEC, LHWT, GAPT, Huawei and SMIC will speak at Agilent's booth to initiate a new era of close cooperation, which includes collaboration between Agilent's Shanghai Application Development Center (ADC) and local semiconductor companies. The center provides software developers with global resources from Agilent to assist with test program development. Shanghai ADC's work has been validated by recent accolades from the Shanghai municipal government.

"Agilent's worldwide experience and technical expertise reduced support uncertainty, increased tester utilization, and contributed to technology innovation and talent cultivation," said C.K. Lin, GAPT chief executive officer. "With Agilent's commitment and investment in engineering test solution development, we are able to better integrate the whole supply chain to create synergy and spur industrial development."

China's steady economic growth has it in a position to become the world's second-largest consumer IC marketplace, second only to the United States. The industry's output value is expected to rank $6.5 billion this year and amount to $7.2 billion in 2005(1).

About Agilent's Automated Test Products
The Agilent 93000 SOC series is the industry's fastest growing, lowest cost single, scalable platform with more than 600 installed systems worldwide. The Agilent 93000 SOC series is designed to meet both the demanding performance and cost challenges of SOC testing, including ultra-high-speed digital, mixed-signal and RF applications.

The Agilent 4070 series is the market leader in parametric testing that provides total solutions for precision dc measurement, capacitance measurement, flash memory cell testing, and other high-frequency applications. It provides low-cost solutions and high reliability.

Agilent's market-leading Versatest series of memory test systems is optimized for testing discrete, burst mode and embedded flash memories. High throughput combined with increased reliability and flexibility provides the lowest cost of test for flash memory.

More information about Agilent's semiconductor test products is available at

About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is a global technology leader in communications, electronics, life sciences and chemical analysis. The company's 28,000 employees serve customers in more than 110 countries. Agilent had net revenue of $6.1 billion in fiscal year 2003. Information about Agilent is available on the Web at

(1) "Mainland China's IC output forecast to hit $7.2B in 2005," Feb. 19, 2004, Electronic Engineering Times.

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