10/7/2004 - Mentor Graphics Corporation (Nasdaq: MENT) announced new automated functionality in its industry-leading automatic test pattern generation tool (ATPG), FastScanTM, and its TestKompress® embedded deterministic test tool. The ATPG Expert feature automatically analyzes the design and manages all the complexities of test pattern generation to achieve optimal results in terms of test coverage, pattern count and run times.
As design processes move to nanometer geometries, selecting the most effective ATPG parameters to achieve desired results can be a daunting task. The ATPG Expert feature works as an internal "expert" within the FastScan or TestKompress tools to automatically analyze the design and make the decisions needed to produce the best results. It manages test generation complexities, such as how to deal with RAM shadow logic, and determines the sequential depth or abort limits to set, the types of compression to exploit, and how to handle clock interactions and bus contention. The result is higher coverage, minimal pattern count and optimized run times.
"The move to nanometer design brings with it a number of new complexities and uncertainties. By automating more of the ATPG process, our goal is to add certainty and to simplify the process of achieving optimal test results," said Robert Hum, vice president and general manager, Design Verification and Test division, Mentor Graphics. "We incorporate the same functionality available in the FastScan tool into the TestKompress tool so customers can easily adopt and integrate these tools into their design flow for comprehensive and scalable test solution."
About FastScan and TestKompress
The FastScan and TestKompress tools are the most advanced ATPG tools available. Easily integrated into any standard design flow, they provide the highest test coverage while dramatically reducing test-pattern-generation time. Both tools offer a wide range of fault models and pattern types for more thorough testing, comprehensive design rules checks, and innovative algorithms for performance-oriented pattern compaction. Based on the ATPG methodology, the TestKompress tool features dramatic compression capabilities designed to reduce test data volume by up to 100X while improving test quality and cost. The ATPG Expert feature is available in the current versions of both tools. For more information visit www.mentor.com/dft.
About Mentor Graphics
Mentor Graphics Corporation (Nasdaq: MENT) is a world leader in electronic hardware and software design solutions, providing products, consulting services and award-winning support for the world's most successful electronics and semiconductor companies. Established in 1981, the company reported revenues over the last 12 months of about $675 million and employs approximately 3,800 people worldwide. Corporate headquarters are located at 8005 S.W. Boeckman Road, Wilsonville, Oregon 97070-7777; Silicon Valley headquarters are located at 1001 Ridder Park Drive, San Jose, California 95131-2314. World Wide Web site: http://www.mentor.com/.
Mentor Graphics and Testkompress are registered trademarks and FastScan is a trademark of Mentor Graphics Corporation.
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