Samsung Selects Agilent's Parametric Testers for 300 mm Wafer Production

7/17/2003 - Agilent Technologies Inc. (NYSE: A) announced that Samsung Electronics Co. Ltd. has selected Agilent 4070 Series fully automated parametric testers for its 300 mm wafer fabs. The 4070 Series will test Samsung's 300 mm dynamic random access memory (DRAM) and Flash memory devices, which are part of many popular computing and consumer electronics devices.

The 4070 Series features fast test speeds and highly accurate measurements, and has become the de facto standard for advanced parametric production test. The Agilent 4070 Series places DC measurement resources in the testhead and uses intelligent measurement range control to speed up sweep measurements by 30 percent or more. The 4070 solution supports all current SEMI standards for 300 mm automated fabs, thus reducing Samsung's cost of test by decreasing the time required to integrate the system into its overall 300 mm factory environment.

"Leading companies like Samsung are always looking for ways to make the semiconductor test process more efficient to increase their return on expensive fab investments," said Minoru Ebihara, general manager of Agilent's Hachioji Semiconductor Test Division. "The Agilent 4070 underscores Agilent's commitment to delivering the most valuable systems and support to help customers overcome their test challenges."

About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is a global technology leader in communications, electronics, life sciences and chemical analysis. The company's 32,000 employees serve customers in more than 110 countries. Agilent had net revenue of $6 billion in fiscal year 2002. Information about Agilent is available on the Web at

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