7/18/2002 - Agilent Technologies Inc. (NYSE: A) today announced multiple hardware and software additions to its memory and parametric product families, as well as expanded capabilities for its single, scalable SOC platform. Agilent's new solutions and enhancements to the various automated test equipment (ATE) product families employ versatile technology for multiple product configurations designed to lower the cost of test in key growth markets, including network processing, high-speed communication, wireless, digital consumer electronics and flash memory.
New Models and Enhancements:
Agilent P330 -- New Wafer-Sort Capabilities for the Agilent 93000 Tester
The Agilent P330 is an addition to the Agilent P-models at the low end of the 93000 SOC Series tester's performance range. With scalability up to 1250 Mbps, the P330 significantly increases the useful life of customers' equipment and protects their investments. It is optimized for graphics chips, chip sets and MPUs, and offers the same high accuracy and advanced signal quality as all other Agilent P-models. The P330 delivers high fault coverage at wafer sort, resulting in lower assembly, packaging and final test costs. Overall timing accuracy of 200 ps enables users to fully exploit process margins for improved yield.
Agilent RF Measurement Suite -- Wireless LAN Enhancements
Leading-edge RF capability on the Agilent 93000 SOC Series, including new wide bandwidth receiver, error vector magnitude (EVM) measurements, and OFDM to 6 GHz, enable the 93000 to cost-effectively test a broad range of WLAN RFICs. Agilent is showcasing the 93000 with the RF Measurement Suite's WLAN test capabilities on an 802.11b+g chip in dual-site and also on Systemonic's 802.11a+b chip. For more information, go to www.ate.agilent.com/STE/NEWS/SOC_TEST/WLAN.shtml
Agilent SmarTest Program Generator 1.1 -- Makes Concurrent Test Simple
SmarTest PG Version 1.1, an add-on software package for the Agilent 93000, represents a breakthrough in how SOC test programs are developed. Rather than simply translating files like most other commercial program generators, SmarTest PG 1.1 allows the user to specify the ports to be tested, then manages the test development process for each port from data extraction to generation of directly downloadable files for the 93000 Series. In addition, SmarTest PG 1.1 automatically keeps track of the tester resource requirements for all of the ports, allowing the user to manage the tester resources as efficiently as possible.
Agilent E5270 Series -- A Scalable Platform for Parametric Test
The Agilent E5270 Series is a scalable parametric test solution, offering multiple configurations at varying price/performance points to cost-effectively address wide-ranging test challenges for optical communications, and complex RF and MOS wafers. The E5270 consolidates multiple capabilities into an integrated instrument family, enabling lower-cost, higher-performance parametric test solutions without associated integration issues. For more information, go to www.ate.agilent.com/STE/NEWS/PARAMETRIC_TEST/E5270.shtml
Agilent E3340A -- Software Simplifies Parametric Data Management
The Agilent E3340A is an integrated data management and analysis solution tailored to the needs of semiconductor process, development and integration environments. The Agilent E3340A streamlines large quantities of exploratory test data into a concise set of visual records that can be analyzed, manipulated and re-used to reduce parametric testing time. The E3340A works in tandem with the Agilent 4070 Series parametric test system and semiconductor process evaluation core software (SPECS) 3.0 to comprise a complete parametric test and data management solution. For more information, go to www.ate.agilent.com/STE/NEWS/PARAMETRIC_TEST/E3340A.shtml
Agilent V4100 -- Increased Capability in Memory Testing
A new member of the Agilent/Versatest Series memory-product family, the V4100 helps users meet the challenges of testing an increasingly diverse mix of memory products. The V4100 is a nine-site (576-pin), cost-effective memory and logic tester for customers that test a wide range of devices, including memory, embedded memory, logic and MCUs. It offers the same proven performance and features of the V4400. For more information, go to www.ate.agilent.com/STE/NEWS/MEMORY_TEST/memory_tester.shtml
The new hardware and software components throughout Agilent's ATE product line enable users to further optimize the mix of testing capabilities for high-speed digital, mixed-signal, RF and memory devices. The new components, available at varying price/performance levels, also allow users the flexibility to adjust testing requirements as device technologies evolve.
"We base our business on helping our customers succeed in a highly volatile, unpredictable market where they have to be ready for anything," said Jack Trautman, senior vice president and general manager of Agilent's Automated Test Group. "That means providing flexible, scalable, reconfigurable products that maximize customers' capital investment and minimize their time to market, while at the same time helping to close the loop between design and test."
Agilent will showcase these new products and more at booth no. 10516 at SEMICON West 2002 in San Jose. Agilent's media kit is available at www.ate.agilent.com/STE/NEWS/INTELLIGENT_TEST/semiwest2k2_kit.shtml
Additional news about Agilent's semiconductor test products is available at www.agilent.com/see/semitestnews
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is a global technology leader in communications, electronics and life sciences. The company's 37,000 employees serve customers in more than 120 countries. Agilent had net revenue of $8.4 billion in fiscal year 2001. Information about Agilent is available on the Web at www.agilent.com
Paul Guerrero, Agilent
+1 408 553 6820
KVO Public Relations, for Agilent
+1 503 221 2398
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