7/18/2002 - Agilent Technologies Inc. (NYSE: A) today announced a new series of parametric test solutions for optical communications, complex radio frequency (RF) semiconductors, optical communications semiconductors and metal-oxide semiconductor (MOS) wafers. The Agilent E5270 Series is the only integrated scalable parametric test solution to offer multiple configurations at a variety of price/performance points to cost-effectively address a wide range of test challenges.
"The Agilent E5270 Series consolidates multiple capabilities into an integrated instrument family, enabling lower-cost, higher-performance parametric test solutions without associated integration issues," said Kenzo Ishiguro, parametric test business manager of Agilent's Hachioji Semiconductor Test Division. "Housing and effectively managing multiple SMUs in a single mainframe is the key to the E5270 Series' ability to perform advanced parametric tests without driving up the cost of test."
The E5270 Series mixes a multi-SMU architecture with two selectable analog-to-digital converter (ADC) configurations, resulting in reduced test times and improved throughput. Each instrument contains a shared ADC, which can be used with all of the instrument's SMUs when high-precision measurements are required. Each of the instrument's individual SMUs also has its own dedicated ADC, which enables faster measurements and higher throughput rates. This selectable ADC architecture gives the E5270 Series unsurpassed versatility for a variety of parametric test needs.
The E5270 Series also possesses an enhanced triggering scheme that enables SMU resources to be easily synchronized with a variety of other instruments. Sixteen user-programmable trigger-in/trigger-out pins are available for use, and trigger signals are routed directly through the instrument hardware resulting in the fastest trigger response possible.
The Agilent E5270 Series is a code-compatible replacement for the Agilent 4142B, ensuring a painless migration as users move to capitalize on the advanced capabilities of Agilent's latest parametric instrument solution. Users of the 4142B will find the E5270 Series familiar and easy to use.
Two Mainframe Architectures Provide Specialized Test Capabilities
The E5270 Series' two mainframe options offer performance to cover a broader range of testing needs. The two-channel mainframes, the E5272A and E5273A, are ideal for production test of optical components, including laser diodes and photo diodes, when two SMUs are necessary. The E5272A features two medium-power SMUs (MPSMU, MPSMU), while the E5273A includes one high-power SMU and one medium-power SMU (HPSMU, MPSMU).
The second option, the E5270A, is an eight-slot user-configurable parametric measurement mainframe, which houses up to four HPSMUs or eight MPSMUs, creating a one-to-eight-channel test solution. The E5270A is ideal for testing RF devices, particularly monolithic microwave integrated circuits (MMICs), which require multiple DC bias sources on their non-RF pins during test. The E5270A can be configured with up to eight DC bias sources, reducing the overall number of touchdowns necessary to test MMIC wafers. The E5270A is also ideal for semiconductor characterization, where four or more SMUs are needed, or in situations where more than one HPSMU is required.
U.S. Price and Availability
The Agilent E5270 Series of parametric test solutions are priced starting at $13,000. They are available for order beginning Sept. 1, and are expected to begin shipping in January of 2003.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is a global technology leader in communications, electronics and life sciences. The company's 37,000 employees serve customers in more than 120 countries. Agilent had net revenue of $8.4 billion in fiscal year 2001. Information about Agilent is available on the Web at www.agilent.com
Paul Guerrero, Agilent
+1 970 635 6013
KVO Public Relations, for Agilent
+1 503 221 2378
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