ATMOS Corporation Achieves Superior Soft Error Rate Results for SoC-RAM High-density 1T Embedded Memory at TSMC Test Lab

5/6/2002 - System-on-a-chip designs for high-performance, high-permanency applications will benefit from the robust design and high reliability of ATMOS SoC-RAM, which has achieved superior soft error results for 1T embedded memory in the 0.18µm technology node at TSMC’s test facility in Hsin-Chu, Taiwan. Measured onsite at TSMC using the industry’s baseline SER test lab for embedded memory, SoC-RAM exhibited less than 800 failures in time (FITs) per megabit, and is comparable to that of embedded SRAM at 0.18µm.

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