Texas Instruments Demonstrates Continued Commitment to Reliability at Semiconductor Industry Symposium

4/8/2002 - Scientists from Texas Instruments (NYSE: TXN) (TI) Incorporated will outline advanced process technology initiatives, chip design techniques, and modeling and simulation tools the company has developed in its leadership role to reduce soft error rates (SERs) in key papers and tutorials delivered during the International Reliability Physics Symposium (IRPS), in Dallas April 7-11. TI researchers also will be presenting information on MOSFET transistor degradation mechanisms, copper interconnect reliability, ferroelectric memory reliability and digital micromirror device reliability.

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