NI Integrates with Boundary-Scan Technology to Lower Cost of Test

2/19/2002 - National Instruments today announced seamless integration between NI's software platform for manufacturing test and JTAG Technologies' leading boundary-scan (IEEE 1149.1) tools. This integration builds on the industry-standard PXI modular instrumentation platform and extends NI's extensive functional test and optical inspection capabilities to include boundary-scan -- providing a single, low-cost platform for test.

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