12/6/2002 - Agilent Technologies Inc. (NYSE:A) announced two new models of the Agilent 4070 Series test system. The Agilent 4072B and 4073B enable semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in advanced semiconductor wafer manufacturing processes by offering up to 40 percent higher throughput.
The new members of the 4070 Series feature an integrated high-speed capacitance meter, which is embedded into each system's test head. The integrated capacitance meter performs measurements up to three times faster than previous models of the 4070 Series, and is the main feature contributing to the overall throughput and productivity improvements of the new test systems.
The 4073B also provides ultra-low current measurements for advanced laboratory or production test. In addition, both new systems feature hardware and firmware enhancements that reduce DC current measurement time by up to 20 percent in ranges 1uA or larger. In typical parametric test, the 4072B and 4073B provide about 40 percent higher throughput.
"Although the 4072B and 4073B offer a dramatic throughput improvement, our customers will still benefit from the 4070 Series platform's exceptional repeatability and measurement accuracy. These systems extend our leadership by answering the test challenges posed by emerging semiconductor production methods," said Minoru Ebihara, general manager of Agilent's Hachioji Semiconductor Test Division. "The 4070 Series will remain the world's leading test platform for recipe and process monitoring in semiconductor manufacturing far into the future."
The 4072B and 4073B are fully compatible with earlier versions of the 4070 Series. Test engineers can use the same test programs and measurement algorithms used on older 4070 Series testers, saving valuable test program development time. The new models are also command compatible with earlier 4070 Series systems, eliminating ramp-up time associated with learning how to control a new test system.
With an installed base of more than 2500 units worldwide, the 4070 Series offers semiconductor test engineers proven parametric test performance. The 4072B and 4073B build on the 4070 Series' reputation by adding high-speed capacitance measurement, higher-speed current measurement, multi-frequency capacitance measurement up to 2 MHz, and new frequency sweep commands. Every model of the 4070 Series enables full automation, is customizable, boasts high throughput rates, and is generally known for highly accurate measurements. Additionally, the 4070 Series supports SPECS, SPECS-FA, VPA/PME and PDQ-WLR, and is ideal for supporting fully automated 300mm processes.
New 4072B and 4073B on Demonstration at SEMICON Japan 2002
Agilent is demonstrating the parametric test capabilities of the 4072B and 4073B at SEMICON Japan, booth, no. 9-A703.
U.S. Price and Availability
The Agilent 4072B is priced at $280,000, and the 4073B is priced at $340,000 including installation and one-time on-site calibration. Both systems are expected to be available for order in February 2003, and are expected to begin shipping in May 2003.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is a global technology leader in communications, electronics and life sciences. The company's 36,000 employees serve customers in more than 120 countries. Agilent had net revenue of $6 billion in fiscal year 2002. Information about Agilent is available on the Web at www.agilent.com.
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