Infineon Selects Agilent Technologies' Semiconductor Parametric Test Systems for Testing of Silicon Wafers Used in Memory Devices

1/8/2002 - Agilent Technologies Inc. (NYSE: A) today announced that Infineon Technologies has chosen Agilent's semiconductor parametric test (SPT) systems for production testing of silicon wafers used in memory devices. The test systems will be used in Infineon's Dresden, Germany facility as the company moves toward volume production of 300mm silicon wafers.

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