QA, Testing News
- XJTAG Enables TTPCom to Debug, Test BGAs on Wireless Development Platform
- 7 layers Selects Aeroflex's 6401 AIME/CT with ISHO for 3G Handset Testing
- Tundra Semiconductor First to Create RapidIO Interoperability Lab
- Macraigor Debuts usb2Demon and usb2Sprite USB 2.0 JTAG Interface Devices
- Aeroflex, CETECOM to Develop WiMAX 802.16e Conformance Test Solution
- Aeroflex Rolls Out 4550 Flying Probe Test System with Faster Probing
- Banner Software Releases ER/DataGen for Generating Test Data
- Aeroflex Rolls Out Industry's First Commercial HSUPA Test Mobile System
- Aeroflex Speeds PXI-based Testing for RFICs and Mobile Handsets
- Encounter True-Time Maximizes Delay Test Coverage for Kawasaki Micro
- Cadence Improves Delay Test Quality by Supporting STARC Technology
- Cadence and Agilent Validate Encounter with 93000 SOC Test System
- Atmel Tapes Out First Single-Chip DVD/CD SoC with Cadence Encounter Test
- Aeroflex Offers Digital Spectrum Monitoring to Phase Noise Test System
- Aeroflex Introduces TX501 RF Multi-band 3G Frequency Translator
- Aeroflex Unveils High Speed Uplink Packet Access (HSUPA) Test Capability
- Motorola's ADR Testing Service Selects Aeroflex HSDPA Conformance Test System
- froglogic Rolls Out Squish 2.0 Qt Automated GUI Test Tool
- Aeroflex Introduces IFR3902 2.7GHz Radio Test System
- Aeroflex Reduces Cost of RF Test Systems by 5x with New PXI Products
- Hansatech and XJTAG Team for Global Boundary Scan Test Solution
- OpenLogic's BlueGlue 3.2 Enables Companies to Leverage Open Source Tools
- Aeroflex First to Submit Working HSDPA Conformance Test Case
- Measurement Computing's UL for LabVIEW Supports NI-DAQmx VIs
- Virtio's VPDA295 Software Development Platform Empowers Audio Designers
- Cadence Debuts Encounter Test Architect for Full-Chip Testing
- Macraigor Unveils J-Scan Low-Cost Debugging and Programming Tool
- nCipher Tests and Debugs PCBs with Boundary Scan Test Solution
- QNX and Fabric Embedded Tools Target High-Performance RapidIO Systems
- SDC Systems Distributes Embedded Hardware Testing Technology for Kozio
- XJTAG Demonstrates Boundary Scan System with Free Board Test Service
- Measurement Computing Joins LXI Consortium for LAN-based Test Systems
- Reactive Systems Rolls Out Reactis V2004.2 Testing and Validation Tool
- XJTAG Introduces XJRunner Add-on to Boundary Scan Development System
- AdventNet Debuts QEngine WebTest 4.1 Web Application Testing Software
- Eclipse Test & Performance Tools Platform Project 3.2 Rolls Out
- Agilent, Synopsys Debut First Scan Diagnostics Reference Methodology
- CMC Introduces EE-WPA Multi-Station Test System for WPA-Enterprise
- NI Rolls Out FlexRay Virtual Instrument Library for LabVIEW
- Ateme Participates in MPEGIF's MPEG-4 AVC Interoperability Tests
- TimeSys Unveils Eclipse 3.0-based TimeStorm Embedded Linux Tools
- VectorCAST Integrates with Concurrent's MaxAda Ada Tool
- SynTest Signs QualCore Logic as Distribution Partner for India
- Agilent Announces High-Speed I/O Solution for Testing SOC Devices
- Synopsys Galaxy Test Reduces Test Data Volume for STMicroelectronics
- NVIDIA Adopts Synopsys' Galaxy Physically Aware Test Solution
- NI Refines Scale-Model Testing at Caterpillar with LabVIEW and PXI
- Compuware Debuts Vantage Solution for Preproduction Service Assurance
- Logicvision, Magma Ensure Interoperability Between icBIST, Blast Create
- Magma, Teseda Team for Seamless IC Implementation, Diagnostic, Test Flow
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